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OmniProbe 350

OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and intuitive control means you can work quickly and confidently without the risk of damage or sample loss.


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    Based on our 9generation probe design OmniProbe 350 delivers precise nanoscale control from a compact, port mounted footprint which minimises interference with other detectors and accessories. With a stable probe platform and sub-nanometre piezoelectric motors, our current generation of probes has low vibration, low drift, and superb positioning accuracy, which is combined with our intuitive user interface, where movement direction is calibrated to the image.

    结果是用于例行升空的类领先性能,并且当与可变倾斜电网保持器时,OmniProbe 350可以创建平面图和TKD样品,而无需直接处理电网或复杂的多级升降机。

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    OmniProbe 350

    了解为什么万心一网350是快速高效的常规TEM薄片制备的最佳3轴纳米操纵器

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    Superior linearity -线性is a measure of the deviation of the probe tip from the requested movement direction. A probe that moves in a straight line in all directions can:

    • Lift-out safely, without hitting the side of the trench
    • Produce TEM lamella faster using smaller milled trenches

    直观的用户界面where controls directly reflect the movement of the probe in the electron image

    Smooth continuous motion- 薄片制备工作流程要求探头使物理接触和平滑运动确保这可以在没有掉落或损坏样品的情况下进行。

    Precise movementwith stored positions

    • 通过单击从完全缩回到操作位置
    • Save user defined working positions

    稳定的探针平台- 稳定性是振动和漂移的组合。将样品连接到探针尖端通过可能需要几分钟的气体沉积过程完成。在此过程中尖端的任何漂移或振动都会导致样品内的应力或样品的突然移动在无切割

    • 稳定的Omniprobe平台在空闲时最小化振动和漂移,减少了这些风险

    Port mounteddesign retracts fully within the chamber when not in use so there is no compromise to your microscope

    • No restriction on sample size
    • No restriction on stage tilt
    • No interference with other detectors or accessories

    探针电气连接包括+/- 10V电源用于电压对比度成像

    • 低噪声选项可以与第三方电子产品组合,以执行EBIC,EBAC和其他电气测试方法。

    使用下面的Handy比较表可帮助您为应用程序选择最佳的OmniProbe并进行比较规范。

    规格 OMNIPROBE
    冷冻 OmniProbe 350 OmniProbe 400
    线性 500 nm 500 nm 250 nm
    编码器分辨率 <50nm <50 nm. 10 nm
    插入重复性 15 μm* 5μm. 2μm
    最小速度 50 nm/s 50 nm/s 10 nm / s
    Max Velocity 250μm/ s 250μm/ s 500 μm/s
    经验丰富的旋转
    Integrated temperature sensor
    Application
    Site specific lift-out
    Plan-view P P
    排泄免费平面图
    Backside Thinning P
    Atom Probe tomography sample preparation P P
    低温提升
    Voltage contrast imaging
    Charge neutralisation
    On-Tip analysis
    EBIC测量 O O
    EBAC measurements O O
    In Situtip change O

    P: Requires an OmniPivot holder O: Available as Option * at constant temperature

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