OmniProbe 350
了解为什么万心一网350是快速高效的常规TEM薄片制备的最佳3轴纳米操纵器
OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and intuitive control means you can work quickly and confidently without the risk of damage or sample loss.
Based on our 9钍generation probe design OmniProbe 350 delivers precise nanoscale control from a compact, port mounted footprint which minimises interference with other detectors and accessories. With a stable probe platform and sub-nanometre piezoelectric motors, our current generation of probes has low vibration, low drift, and superb positioning accuracy, which is combined with our intuitive user interface, where movement direction is calibrated to the image.
结果是用于例行升空的类领先性能,并且当与可变倾斜电网保持器时,OmniProbe 350可以创建平面图和TKD样品,而无需直接处理电网或复杂的多级升降机。
Superior linearity -线性is a measure of the deviation of the probe tip from the requested movement direction. A probe that moves in a straight line in all directions can:
直观的用户界面where controls directly reflect the movement of the probe in the electron image
Smooth continuous motion- 薄片制备工作流程要求探头使物理接触和平滑运动确保这可以在没有掉落或损坏样品的情况下进行。
Precise movementwith stored positions
稳定的探针平台- 稳定性是振动和漂移的组合。将样品连接到探针尖端通过可能需要几分钟的气体沉积过程完成。在此过程中尖端的任何漂移或振动都会导致样品内的应力或样品的突然移动在无切割
Port mounteddesign retracts fully within the chamber when not in use so there is no compromise to your microscope
探针电气连接包括+/- 10V电源用于电压对比度成像
使用下面的Handy比较表可帮助您为应用程序选择最佳的OmniProbe并进行比较规范。
规格 | OMNIPROBE | ||
冷冻 | OmniProbe 350 | OmniProbe 400 | |
线性 | 500 nm | 500 nm | 250 nm |
编码器分辨率 | <50nm | <50 nm. | 10 nm |
插入重复性 | 15 μm* | 5μm. | 2μm |
最小速度 | 50 nm/s | 50 nm/s | 10 nm / s |
Max Velocity | 250μm/ s | 250μm/ s | 500 μm/s |
经验丰富的旋转 | ✘ | ✘ | ✔ |
Integrated temperature sensor | ✔ | ✘ | ✘ |
Application | |||
Site specific lift-out | ✔ | ✔ | ✔ |
Plan-view | P | P | ✔ |
排泄免费平面图 | ✘ | ✘ | ✔ |
Backside Thinning | ✘ | ✘ | P |
Atom Probe tomography sample preparation | P | P | ✔ |
低温提升 | ✔ | ✘ | ✘ |
Voltage contrast imaging | ✘ | ✔ | ✔ |
Charge neutralisation | ✔ | ✔ | ✔ |
On-Tip analysis | ✘ | ✘ | ✔ |
EBIC测量 | ✘ | O | O |
EBAC measurements | ✘ | O | O |
In Situtip change | ✘ | O | ✔ |
P: Requires an OmniPivot holder O: Available as Option * at constant temperature