C-Swift+

C-Swift+是类领先的高吞吐量EBSD检测器。和对称S3检测器，C-Swift+使用定制的CMOS传感器以及光纤，以提供速度和灵敏度，从而确保甚至最具挑战性的材料上的高质量结果。

The C-Swift+’s maximum speed of 2000 pps is achieved with good pattern resolution (156 x 128 pixels), representing 4 times the number of pixels than is used by a comparable CCD-based detector operating at much lower speeds, ensuring reliable indexing, high hit rates and impressive throughput on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the AZtec software, enables the C-Swift+ to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, the C-Swift+ can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis.

这是一个用于快速，有效样品表征的检测器。系统的每个组件，从唯一的接近传感器到可选的集成的前传探测器，都设计为最大程度地提高性能和易用性，并使EBSD成为每个实验室的标准工具。