News & Events
Oxford Instruments, in collaboration with Zeiss & Swerim, will host a free Microscopy workshop on advanced techniques for analysis of metals, such as Image analysis using machine learning, FIB-SEM and LAB dCT synchrotron style crystallography, and the latest developments in EDS & EBSD.
| Time | Title | Presenter |
| 9:30 - 9:50 | 打破fast mingle | |
| 9:50 - 10:00 | Welcome & Introduction | Fredrik Gustavsson – Swerim |
| 10:00 - 10:45 | Techniques in optical microscopy (an introduction) Machine learning & GxP Surface analysis: roughness, wear, contamination, corrosion, coatings | Andy Holwell, ZEISS |
| 10:45 - 10:55 | 打破 | |
| 10:55 - 11:40 | Correlative microscopy Technology focus on FESEM, Sigma and Gemini Introduction to FIB-SEM, the ZEISS Crossbeam | Andy Holwell, ZEISS |
| 11:40 - 11:50 | 打破 | |
| 11:50 - 12:30 | 飞秒激光——大规模ablation for rapid sample preparation in FIB-SEM 3D, 4D and correlative tomography (includes FIB-EDS/EBSD, Atlas) LabDCT – non-destructive synchrotron-style 3D crystallography of metals in the laboratory | Andy Holwell, ZEISS |
| 12:30 - 13:30 | ZEISS & Oxford invites all for lunch | |
| 13:30 - 14:15 | Latest development in X-ray analysis | Sam Marks, Oxford Nordiska |
| 14:15 - 14:30 | 打破 | |
| 14:30 - 15:15 | Latest development in EBSD analysis | Håkan Vikström, Oxford Nordiska |
Location
Swerim, Kista
Date
6 November
Business
NanoAnalysis
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