庇护研究Webinar: AFM Tools for Thin Film Analysis

描述

薄膜和涂料在来自普通消费品到下一代光伏和数据存储的一切中都是至关重要的。无论应用如何，通过控制和操纵微型和纳米长度尺度的材料，越来越多地实现增强的薄膜性能。因此，需要测量类似尺度上的膜结构和性质的性能相应地具有相应的重要性。

In this webinar, we explore the powerful capabilities of today’s atomic force microscopes (AFMs) for characterizing thin films. For example, the AFM is well known for its high-resolution topographic imaging capabilities. But recent improvements in speed, sensitivity, and ease of use make it more valuable than ever for quantifying 3D roughness and texture. We cover the basic concepts of surface imaging and analysis, and show illustrative examples.

Research and instrumentation advances have also produced a variety of AFM techniques to characterize electrical, electromechanical, and other functional response. We overview these techniques and discuss in detail an example of their application to memory access devices in the semiconductor industry. New capabilities for nanomechanical imaging are also briefly introduced.

With examples that cover a wide range of systems, this webinar highlights the impact and versatility of advanced AFMs for thin-film research and development.

About Your Lecturers

唐娜博士Hurley，顾问，Lark Scientific LLC

Dr. Kumar Virwani, Staff Member, IBM Research-Almaden