庇护研究Webinar: Asylum AFM Tools for Characterizing 2D Materials

描述

Dr. Andras Kis of EPFL Institute of Electrical Engineering and Keith Jones, Asylum Research's nanoelectrical characterization specialist, are your hosts. They discuss the integral role of AFM in 2D materials research and present tools and techniques to successfully characterize a variety of 2D materials used for device manufacturing, energy storage and optoelectronics. Learn about AFM modes for mapping physical properties and see how they can evaluate local electrical, mechanical and functional response. They also discuss how AFM can now be used to accurately determine the thickness of single or multiple layers of a 2D material, challenging a common misconception.

Included are results on the following studies:

• Molybdenum disulfide (MoS₂）和石墨烯.
• 机械性能的测量
• Kelvin探针成像（KPFM）操作晶体管
• Electrical characterization
• Detailed discussions of these modes:
  • KPFM
  • Piezoresponse force microscopy (PFM)
  • Conductive AFM
  • 扫描微波阻抗成像（SMIM）

关于你的讲师：

Andras Kis是Ecole Polytechnique Federale de Lausanne（EPFL），工程学院（STI），电气工程研究所（IEL）副教授，具有研究专注于开发2D材料。他的小组展示了基于2D半导体的第一晶体管。他拥有超过16年的AFM经验，包括63个同行评审论文，在科学会议上有超过50个邀请谈判，以及参加众多2D材料和石墨烯会议的组织委员会。他也是自然合作伙伴期刊，“2D材料和应用”的主编。万博电脑网页版登录KIS教授从EPFL获得了他的博士学位，并在Univ下了他的帖子。加利福尼亚伯克利，Zettl Lab。

Keith Jones is an Application Scientist at Oxford Instruments Asylum Research (12 years). He has more than 18 years of SPM experience specializing in nanoelectrical characterization and was instrumental in developing and applying electrical AFM techniques, such as dopant profiling and scanning microwave impedance microscopy. Keith is also a co-inventor on a patent for scanning impedance microscopy and has co-authored 34 published papers. Keith received his M.S. in Physics at Virginia Commonwealth University.