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Cypher S.AFM Microscope

The Asylum ResearchCypher S.is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.

  • 常规实现比其他AFM显微镜更高的分辨率

  • 快速扫描结果以秒为单位而不是分钟
  • Every step of operation is simpler for remarkable productivity
  • Small footprint in the lab, huge potential to grow in capability
  • 支持that goes above and beyond your expectations


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Cypher Family Brochure

常规实现比其他AFM显微镜更高的分辨率

  • 无与伦比的机械稳定性噪音一半that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • 低噪声电子器件 - 电子噪声源的伪像

快速扫描结果以秒为单位而不是分钟

  • 扫描比典型的AFMS快10-100×
  • 支持最快,最小的探针(3×9μm斑块尺寸可选)
  • 快速扫描超越地形 - 也是纳米力学,CAFM,PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™自动为所选模式配置软件
  • 发现™使全电动激光和探测器对齐一键单击
  • GetReal™自动校准悬臂弹簧常数和灵敏度
  • GetStarted™自动设置攻丝模式成像的最佳参数
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • 可用于测量粘弹性的全套纳米力学表征模式(储存/弹性模量和损耗模量)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes

支持that goes above and beyond your expectations

  • 包括标准的一年全面保修
  • 禁止技术支持和基本应用支持生命万博电脑网页版登录
  • 提供延长保修和高级培训的经济实惠的支持协议
  • 轻松升级到的路径Cypher ES要么Cypher VRS

包括操作模式

Contact mode
飞镖PFM.
Dual AC
双交流共振跟踪(DART)
静电力显微镜(EFM)
Force curves
Force Mapping Mode (force volume)
强制调制
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
侧向力模式(LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
压电响应力显微镜(PFM)
开关光谱PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
矢量pfm.

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
接触共振粘弹性映射模式
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
具有快速力映射的当前映射
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)

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